Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features

This book provides cytopathologists a succinct but comprehensive reference covering common diagnostic dilemmas caused by normal, iatrogenic, inflammatory and reactive/reparative changes in cytology samples. This book will provide immediate access to these confounders, clearly illustrating key features and detailing the pitfalls these cells engender in all cytologically accessible body sites.  The text is organized in chapters corresponding to cytologically accessible body sites/organ systems.  Each chapter’s discussions are further organized by general categories of confounders (i.e., normal contaminants, inflammatory, infectious and iatrogenic), with special attention to site specific confounders.        Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features will be of great value to practicing pathologists, pathology residents, cytopathology fellows, cytotechnology technologists and students.

Von G. Samedi, M.D., Ph.D.
Assistant Professor
Department of PathologyUniversity of New Mexico School of Medicine
Interests:
CytopathologySurgical PathologyGastrointestinal Pathology
Education and Certification Information
Fellowship:Fellowship in Cytopathology, Beth Israel Deaconess Medical Center, Boston, MA, 2010-2011
Residency:Residency in Pathology, Beth Israel Deaconess Medical Center, Boston, MA, 2006-2010
Medical School:M.D., University of Florida College of Medicine, Gainesville, FL, 2001-2005
Doctorate:Ph.D., Pharmacology, University of Florida College of Medicine, Gainesville, FL, 1997-2001
Board Certifications:American Board of Pathology certification in Anatomical Pathology, 2012
Specialties:Cytopathology, Surgical Pathology